Ieee Transactions On Device And Materials Reliability

The scope of the publication includes, but is not limited to Reliability of: Devices, Materials, Processes, Interfaces, Integrated Microsystems (including MEMS & Sensors), Transistors, Technology (CMOS, BiCMOS, etc.), Integrated Circuits (IC, SSI, MSI, LSI, ULSI, ELSI, etc.), Thin Film Transistor Applications. The measurement and understanding of the reliability of such entities at each phase, from the concept stage through research and development and into manufacturing scale-up, provides the overall database on the reliability of the devices, materials, processes, package and other necessities for the successful introduction of a product to market. This reliability database is the foundation for a quality product, which meets customer expectation. A product so developed has high reliability. High quality will be achieved because product weaknesses will have been found (root cause analysis) and designed out of the final product. This process of ever increasing reliability and quality will result in a superior product. In the end, reliability and quality are not one thing; but in a sense everything, which can be or has to be done to guarantee that the product successfully performs in the field under customer conditions. Our goal is to capture these advances. An additional objective is to focus cross fertilized communication in the state of the art of reliability of electronic materials and devices and provide fundamental understanding of basic phenomena that affect reliability. In addition, the publication is a forum for interdisciplinary studies on reliability. An overall goal is to provide leading edge/state of the art information, which is critically relevant to the creation of reliable products.

《Ieee Transactions On Device And Materials Reliability》是一本由IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC出版商出版的专业工程技术期刊，该刊创刊于2001年，刊期Quarterly，该刊已被国际权威数据库SCIE、SCI收录。在中科院最新升级版分区表中，该刊分区信息为大类学科：工程技术3区，小类学科：工程：电子与电气 3区；物理：应用 3区；在JCR（Journal Citation Reports）分区等级为Q3。该刊发文范围涵盖工程电子与电气等领域，旨在及时、准确、全面地报道国内外工程电子与电气工作者在该领域取得的最新研究成果、工作进展及学术动态、技术革新等，促进学术交流，鼓励学术创新。2022年影响因子为2，平均审稿速度较慢,6-12周。